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  5. Uncertainty evaluation of the critical temperature measurement in the study of the semiconductor-metal phase transition in vanadium dioxide

Uncertainty evaluation of the critical temperature measurement in the study of the semiconductor-metal phase transition in vanadium dioxide

A.Yu. Karnina, O.P. Klymenko, O.P. Mysov
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In order to maintain the phase transition temperature and its enthalpy the model of the heat balance during the DTA was proposed. It was shown that the temperature SMPT was a function of the temperature difference between sample and reference substance, their amount of matter, specific heats and enthalpy. According to the heat balance model we processed the data which had been received by DTA of VO2, based on which the standard uncertainty of SMPT temperature measurement was evaluated.
Keywords: differential thermal analysis, the standard uncertainty of measurement, the semiconductor-metal phase transition, vanadium dioxide