Increase of efficiency management complex coefficient of reflection of multi-layered structure, containing semiconductor, in millimetric range of wave-lengths
V.I. Karpenko, G.A. Moiseeva
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The analysis of complex coefficient of reflection of multi-layered structure, containing a semiconductor layer is conducted, in the millimetric range of wave-lengths. Requirements are formulated to the basic parameters of multi-layered structures, to providing the increase of efficiency of management their reflecting descriptions.
Keywords: complex coefficient of reflection, multi-layered structure, semiconductor
