Increase of efficiency management complex coefficient of reflection of multi-layered structure, containing semiconductor, in millimetric range of wave-lengths
V.I. Karpenko, G.A. Moiseeva
Annotations languages:
The analysis of complex coefficient of reflection of multi-layered structure, containing a semiconductor layer is conducted, in the millimetric range of wave-lengths. Requirements are formulated to the basic parameters of multi-layered structures, to providing the increase of efficiency of management their reflecting descriptions.
Keywords: complex coefficient of reflection, multi-layered structure, semiconductor
Reference:
Karpenko, V.Y. and Moyseeva, H.A. (2008), "Povыshenye эffektyvnosty upravlenyia kompleksnыm koэffytsyentom otrazhenyia mnohosloinoi strukturы, soderzhashchei poluprovodnyk, v myllymetrovom dyapazone dlyn voln" , Information Processing Systems, Vol. 2(69), pp. 63-64.
Karpenko, V.Y. and Moyseeva, H.A. (2008), "Povыshenye эffektyvnosty upravlenyia kompleksnыm koэffytsyentom otrazhenyia mnohosloinoi strukturы, soderzhashchei poluprovodnyk, v myllymetrovom dyapazone dlyn voln" , Information Processing Systems, Vol. 2(69), pp. 63-64.