1. Science
  2. Publications
  3. Information Processing Systems
  4. 2(69)'2008
  5. Increase of efficiency management complex coefficient of reflection of multi-layered structure, containing semiconductor, in millimetric range of wave-lengths

Increase of efficiency management complex coefficient of reflection of multi-layered structure, containing semiconductor, in millimetric range of wave-lengths

V.I. Karpenko, G.A. Moiseeva
Annotations languages:

The analysis of complex coefficient of reflection of multi-layered structure, containing a semiconductor layer is conducted, in the millimetric range of wave-lengths. Requirements are formulated to the basic parameters of multi-layered structures, to providing the increase of efficiency of management their reflecting descriptions.
Keywords: complex coefficient of reflection, multi-layered structure, semiconductor