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  5. Development of the method of collecting measurement data for the calibration of temperature transmitters semiconductor thermoresistive

Development of the method of collecting measurement data for the calibration of temperature transmitters semiconductor thermoresistive

O.B. Koshelieva, I.S. Zubretskya, S.S. Fedin
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A method for collecting and gathering information for the construction of the measuring calibration characteristics of NTCthermistor in the operating temperature range is elaborated. The results of its practical use for Agilent T10 K thermistors is presented.
Keywords: methods, calibration characteristics, electrical resistance, temperature, NTC-thermistor