About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure
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Description: Influence of temperature action to the influence of temperature action to influence of temperature action to influence of temperature action to influence.
Reference:
Kovalenko, N.Y., Prokhorov, H.V. and Hnap, A.K. (2002), “O parametrycheskoi nadezhnosty komponent tverdotelnoi эlektronyky pry nyzkykh postoiannыkh urovniakh vыsokoэnerhetycheskoho obluchenyia”, Information Processing Systems, Vol. 6(22), pp. 18-24.
Kovalenko, N.Y., Prokhorov, H.V. and Hnap, A.K. (2002), “O parametrycheskoi nadezhnosty komponent tverdotelnoi эlektronyky pry nyzkykh postoiannыkh urovniakh vыsokoэnerhetycheskoho obluchenyia”, Information Processing Systems, Vol. 6(22), pp. 18-24.