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  5. About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure

About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure

М.I. Kovalenko, G.V. Prokhorov, А.К. Gnap
Annotations languages:

Influence of temperature action to the influence of temperature action to influence of temperature action to influence of temperature action to influence.
Reference:
Kovalenko, N.I., Prokhorov, G.V. and Gnap, A.K. (2002), "O parametricheskoi nadezhnosti komponent tverdotelnoi elektroniki pri nizkikh postoiannykh urovniakh vysokoenergeticheskogo oblucheniia" , Information Processing Systems, Vol. 6(22), pp. 18-24.