1. Science
  2. Publications
  3. Information Processing Systems
  4. 6(22)'2002
  5. About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure

About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure

М.I. Kovalenko, G.V. Prokhorov, А.К. Gnap
Annotations languages:

Influence of temperature action to the influence of temperature action to influence of temperature action to influence of temperature action to influence.