About parametric reliability of components of a solid-state electronics engineering at low stationary values levels of a high-energy exposure
М.I. Kovalenko, G.V. Prokhorov, А.К. Gnap
Annotations languages:
Influence of temperature action to the influence of temperature action to influence of temperature action to influence of temperature action to influence.
Reference:
Kovalenko, N.I., Prokhorov, G.V. and Gnap, A.K. (2002), "O parametricheskoi nadezhnosti komponent tverdotelnoi elektroniki pri nizkikh postoiannykh urovniakh vysokoenergeticheskogo oblucheniia" , Information Processing Systems, Vol. 6(22), pp. 18-24.
Kovalenko, N.I., Prokhorov, G.V. and Gnap, A.K. (2002), "O parametricheskoi nadezhnosti komponent tverdotelnoi elektroniki pri nizkikh postoiannykh urovniakh vysokoenergeticheskogo oblucheniia" , Information Processing Systems, Vol. 6(22), pp. 18-24.