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  5. Damage accumulation model by information system integrated elements under the impact of nanosecond width polyimpulse

Damage accumulation model by information system integrated elements under the impact of nanosecond width polyimpulse

D. Kucher, L. Litvinenko, N. Smуrуnska
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There are studied and displayed the sequence impact of nanosecond width pulse radiations according to the sensitive elements of the information system receiving path. The received dependence gives the possibility to determine the maximum amount of energy scattered in semiconductor structures under the impact of the n-th number of pulses.
Keywords: powerful electromagnetic radiation, polyimpulse impact, integrated circuits, degradation effects, damage accumulation model