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  5. Estimation of quality of technical and metrological characteristics analytical probabilistic information-measuring systems by results simulation

Estimation of quality of technical and metrological characteristics analytical probabilistic information-measuring systems by results simulation

V. Khizhnyak, A. Lytovchenko, A. Dmytriyev
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Description: Creation of intelligent information-measuring systems, which allow to measure, process and present the results, modeling and optimizing the work of the system and object, determine the requirements for the mathematical models of the information-measuring systems, which form the basis of the research process, design and optimization of the system and provide the opportu-nity operational evaluation of project decisions and target functions in the implementation of optimization procedures. The mathematical model of the signal establishes the correspondence between any moment of time and the signal value. In general, information in the information-measuring systems is carried by measurement signals of various physical nature: in most cases, electromagnetic, less often - optical, acoustic, and the like. The most convenient model for the probabilistic description of the transformation of the informational parameters of the measuring signals in the information-measuring systems is a quasideuter-minal signal model. The article defines a wide range of criteria and indicators of efficiency of the information-measuring systems with the choice of the required level of detail of probabilistic models, which, on the one hand, would in many cases allow the evaluation of different criteria and indicators of the information-measuring systems, and on the other hand, would be convenient in terms of practical implementation of the software models. The possibilities of obtaining quality estimates and forecasting of the main technical and metrological characteristics of analytical probabilistic information-measuring systems based on the simu-lation results are considered.


Keywords: information-measuring systems, random processes, metrological characteristics, probabilistic models

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Reference:
Khyzhniak, V.V., Lytovchenko, A.O. and Dmytriiev, A.H. (2018), “Otsinka yakosti tekhnichnykh i metrolohichnykh kharakterystyk analitychnykh ymovirnisnykh informatsiino-vymiriuvalnykh system za rezultatamy modeliuvannia” [Estimation of quality of technical and metrological characteristics analytical probabilistic information-measuring systems by results simulation], Scientific Works of Kharkiv National Air Force University, Vol. 4(58), pp. 101-107. https://doi.org/10.30748/zhups.2018.58.14.