In the article the basic mechanisms of element base functional defeat of the radioelectronic systems are considered: thermal and electric hasp, effect of "palling", method of damages accumulation. The quality explaining to of effects degradation at the use of sequence of short signals is given.
functional defeat, thermal hasp, electric hasp, degradation of radioelements
"Analyz vozmozhnostei funktsyonalnoho porazhenyia эlementnoi bazы radyoэlektronnыkh system" ,
Systems of Arms and Military Equipment,