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Automation of the cluster analysis of measuring with use of wavelet transforming

G.Y. Shcherbakova, V.N. Krylov
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The method of statistical technological process analysis for electronic apparatus production is suggested. This method based on noise stabilities clustering with wavelet transforming utilization. Such approach allows inspected of technological production process of electronic apparatus with highest level clustering quality. Such approach is recommended in case of control data with high level noise, when the information about form of clusters is absent.
Keywords: checklists, optimization, clustering, wavelet transform