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The estimation of macroscopic parameters of solid plasma in a semiconductor

G.F. Konjahin, A.Ju. Melashenko, A.M. Sotnikov, V.V. Belimov
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The basic approaches to the determination of the basic macroscopic parameters of the semiconductor layer of the radioisotopic type absorber are given in the article.
Reference:
Koniakhyn, H.F., Melashenko, A.Yu., Sotnykov, A.M. and Belymov, V.V. (2002), "Otsenka makroskopycheskykh parametrov tverdotelnoi plazmы v poluprovodnyke" [The estimation of macroscopic parameters of solid plasma in a semiconductor], Information Processing Systems, Vol. 1(17), pp. 228-231.