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  5. The analysis of a capability of control of a complex reflection coefficient of the multilayer structure containing semi-conductors, in a millimeter-wave of lengths of waves

The analysis of a capability of control of a complex reflection coefficient of the multilayer structure containing semi-conductors, in a millimeter-wave of lengths of waves

G. Moiseeva
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The analysis of the multilayer structure containing one or several semi-conductor stratums is conducted. The main mathematical ratio are received, permitting to demand to the main specifications of multilayer structures ensuring control in their reflective performances.