A common approach to the construction of functional checking tests for non-contact induction method of diagnosing radioelectronic components is defined in the papers. Digital memory elements and microcontroller are considered as the radioelectronic components.
method of diagnosis, functional checking test
"Pobudova funktsionalnykh perevirnykh testiv dlia bezkontaktnoho induktsiinoho metodu diahnostuvannia" [Construction of functional checking tests for non-contact induction method of diagnostics],
Science and Technology of the Air Force of Ukraine,