The advanced method of radar receiver entrance paths elements semi-conductor semi-conductor degradation probability definition is offered at use of powerful ultrashort signals sequences. The method allows to define probabilities of damages occurrence to various types of semi-conductor elements at normal and uniform laws of thermal energy distribution. Mathematical modeling of semi-conductor damages occurrence devices probability with use of normal and uniform laws of distributions for thermal energy raising р–n transition is spent. Quantitative estimations for probability of receiver entrance paths refusals are received at use of of powerful multifrequency spatial-temporary signals sequences.
probability of degradation, ultrashort signals, the distribution law, thermal energy